VISION'26 @ CVPR 2026
CVPR 2026

4th workshop on Vision-based InduStrial InspectiON (VISION)

VISION’26 @ CVPR: Vision-Based Industrial Inspection Across Modalities (Surface, X-ray, 3D & More)

Now incorporating the “DEXTER: DEgraded X-ray image Tomography, Enhancement, and Reconstruction” and “INSIDE-X: Intelligent Screening and Imaging For Detection and Exploitation via X-ray” workshops

CVPR 2026 Workshops — Denver, Colorado (June 3rd (Wednesday), Room 205)

Overview

Aims and Scope

The VISION workshop will provide a platform for the exchange of scholarly innovations and emerging practical challenges in Vision-based Industrial Inspection. Through a series of keynote talks, technical presentations, and challenge competitions, this workshop aims to (i) bring together researchers from the interdisciplinary research communities related to computer vision-based inspection; and (ii) connect researchers and industry practitioners to synergize recent research progress and current needs in industrial practice.

In 2026, VISION expands its scope to reflect the merger with the “DEgraded X-ray image Tomography, Enhancement, and Reconstruction” and “Intelligent Screening and Imaging For Detection and Exploitation via X-ray” workshops.

We explicitly welcome contributions across these three tracks, from traditional vision based methods to cross-modality methods and shared challenges in real-world inspection pipelines.

Topics include surface imaging, X-ray, CT, and volumetric reconstruction, 3D sensing modalities, computational imaging, imaging physics, multimodal cross-domain fusion, scene understanding for threat detection, datasets and benchmarking, and real-world deployment and applications.

Keynote Talks

Salman Khan

Salman Khan

Computer Vision Department, MBZUAI

"Towards Generalist and Edge Intelligence for Industrial Inspection"

Dan Cristian Dinca

Dan Cristian Dinca

Rapiscan Systems

"Intelligent Security Screening (X-ray)"

Charles A. Bouman

Charles A. Bouman

Purdue University

"Past, Present, and Future Methods for Sparse View CT"

Paul Shahidi

Paul Shahidi, PhD

Anduril Industries

"Why Most Industrial Vision Systems Fail their First Deployment."

Amir Afrasiabi

Amir Afrasiabi

The Boeing Company

"Self-Validating Augmented Reality Using Artificial Intelligence"

Jennifer Vandoni

Jennifer Vandoni

Safran

"AI for Non-Destructive Testing and Material Characterization in Aerospace"

Program

Agenda

Time Topic
8:00 - 8:15 Chair's Opening Remarks
8:15 - 8:45 Invited Talk I: Paul Shahidi - Why Most Industrial Vision Systems Fail their First Deployment.
8:45 - 9:15 Invited Talk II: Jennifer Vandoni - AI for Non-Destructive Testing and Material Characterization in Aerospace
9:15 - 9:45 Invited Talk III: Dan Cristian Dinca - Intelligent Security Screening (X-ray)
9:45 - 10:55 Coffee Break & Poster Session
10:55 - 12:00 Flash Presentations (65 min, ~13 papers x 5 min)
12:00 - 13:30 Lunch Break
13:30 - 14:00 Invited Talk IV: Charles A. Bouman - Past, Present, and Future Methods for Sparse View CT
14:00 - 14:30 Invited Talk V: Salman Khan - Towards Generalist and Edge Intelligence for Industrial Inspection
14:30 - 15:00 Invited Talk VI: Amir Afrasiabi - Self-Validating Augmented Reality Using Artificial Intelligence
15:00 - 15:55 Coffee Break & Poster Session
15:55 - 16:55 Panel Discussion
16:55 - 18:00 Flash Presentations (65 min, ~13 papers x 5 min)

Call for Papers

Topics of Interest (not limited to)

From an industry point of view:

From an academic point of view:

Submission Instructions

We invite research and industrial papers relevant to the workshop topics. Authors may choose between:

Tracks (new for 2026)

This year, we offer three submission tracks. Authors are encouraged to submit to the track that best matches their paper's focus:

  1. VISION'26 General Track
  2. DEXTER Track: DEgraded X-ray image Tomography, Enhancement, and Reconstruction
  3. INSIDE-X Track: Intelligent Screening and Imaging for Detection and Exploitation via X-ray

Important Dates

Submit Paper Submit paper

Submission for all tracks: March 15th, 2026

Organizers

Organizing Committee

Scott McCloskey

Scott McCloskey

Director of Computational Imaging
Kitware

Naoufel Werghi

Naoufel Werghi

Professor
Khalifa University

Shancong Mou

Shancong Mou

Assistant Professor
University of Minnesota

Jennifer Vandoni

Jennifer Vandoni

R&D Manager
Safran

Juan Du

Juan Du

Assistant Professor
The Hong Kong University of Science and Technology (Guangzhou)

Ramazan Gokberk Cinbis

Ramazan Gokberk Cinbis

Associate Professor
Middle East Technical University

Toby Breckon

Toby Breckon

Professor
Durham University

Samet Akcay

Samet Akcay

Principal AI Research Engineer
Intel

Divya Velayudhan

Divya Velayudhan

Postdoctoral Research Fellow
Khalifa University

Eric Miller

Eric Miller

Professor
Tufts University

Domingo Mery

Domingo Mery

Professor
Universidad Católica de Chile

Mohammed Benammoun

Mohammed Benammoun

Professor
University of Western Australia

Muzammal Naseer

Muzammal Naseer

Assistant Professor
Khalifa University

Taimur Hassan

Taimur Hassan

Assistant Professor
Abu Dhabi University

Brian K. S. Isaac-Medina

Brian K. S. Isaac-Medina

 

Sara Fridovich-Keil

Sara Fridovich-Keil

Assistant Professor
Georgia Tech

Christopher Metzler

Christopher Metzler

Assistant Professor
University of Maryland College Park

John Murray-Bruce

John Murray-Bruce

Assistant Professor
University of South Florida

Xinhan Yang

Xinhan Yang

PhD Student
University of Minnesota

Prior Workshops

VISION'23 @ CVPR 2023

1st workshop on Vision-based Indu Strial InspectiON

CVPR 2023, Vancouver, Canada

VISION'24 @ ECCV 2024

2nd workshop on Vision-based Indu Strial InspectiON

ECCV 2024, Milano, Italy

VISION'25 @ ICCV 2025

3rd workshop on Vision-based Indu Strial InspectiON

ICCV 2025, Honolulu, Hawaii

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